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Z-Axis Depth Measuring Microscope

Titan Tool Supply, Inc introduces a new Z-Axis Depth Measuring Microscope which is designed to measure minute variations in height not easily distinguished by mechanical means.

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Buffalo, New York -- Titan Tool Supply, Inc introduces a new Z-Axis Depth Measuring Microscope which is designed to measure minute variations in height not easily distinguished by mechanical means.

The microscope has many applications in the electronics industry, including the semiconductor field, where it measures heights of the bonded portion of lead wire, wafer bump, lead frames and solder. The new microscope also measures the step height of hybrid integrated circuits and terminal steps on multi-layer PC boards. Other applications include:

  • measuring the depth of minute cracks
  • engraving depth of printing rolls and plastic molds
  • depth grooves of computer diskettes 
  • depth of score on beverage cans

For more information, please visit www.TitanToolSupply.com

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