The Universal Tester III is based on a precision-grade, belt-driven linear module with overall resolution of 79 nanometers. Additionally, the system allows compensation for temperature and pressure variations and performs all test functions 20 percent faster than previous generation testers. The tester allows users to automatically “map” the linearity error of each sensor and program a compensated output characteristic into each sensor. Because the system is completely automatic it will improve testing throughput on the corrected sensors, which helps optimize costs for higher performance products.
MTS Systems Corp., Cary, NC; 919-677-0100; www.mtssensors.com