National Instruments Introduces
Industrys Highest Throughput PXI Frame Grabber
New Module Ideal for End-of-Line Test and Industrial
Inspections Requiring High Data Throughput
NEWS RELEASE June 21, 2011 National Instruments today
announced the NI PXIe-1435 high-performance Camera Link frame
grabber. Engineers can use the new module to integrate
high-speed and high-resolution imaging into their PXI systems, the
industry standard for automated test with more than 1,500
measurement modules available from more than 70 vendors. By
combining high-throughput imaging with the benefits of
off-the-shelf PXI measurement hardware, NI now offers full
software-defined solutions for demanding automated test
applications in industries such as consumer electronics, automotive
and semiconductor.
The NI PXIe-1435 is the industrys highest throughput PXI frame
grabber and acquires from all Camera Link camera configurations,
including 10-tap extended-full, with up to 850 MB/s of throughput.
Engineers can power cameras through Power over Camera Link
(PoCL)-enabled cables, eliminating the need for additional wires in
deployment environments. The frame grabber also offers 512 MB of
DDR2 onboard acquisition memory for added reliability in
transferring large images without fear of data overflow. Onboard
digital I/O includes four bidirectional transistor-transistor logic
(TTL), two opto-isolated inputs and one quadrature encoder for
triggering and communicating inspection results with automation
devices.
The frame grabber incorporates the synchronization, timing, data
streaming and processing capabilities of the PXI Express
specification, and supports image processing on complementary
field-programmable gate array (FPGA) boards to further boost system
performance.
The NI PXIe-1435 frame grabber further complements our capabilities
in the PXI platform, said Matt Friedman, National Instruments
senior product manager for the PXI platform and PXISA board member.
The addition of high-performance imaging to our PXI offerings
enhances our mixed-signal capabilities for high-end test
systems.
The high throughput and low latency of the Camera Link standard
make the frame grabber ideal for line-scan image sensors, which
engineers can use for surface inspection of large areas, including
finding esthetic and functional defects in solar panels and dead
pixels in flat panel displays. The NI PXIe-1435 frame grabber also
works well in many industrial applications, such as fault analysis
using a stop trigger to record images before and after an event on
the factory floor, and medical device applications such as
analyzing intricacies in movement and recording stimulus response
in objects from heart valves to eye corneas.
Engineers can program the new module using NI LabVIEW graphical development
software and the NI
Vision Development Module, a comprehensive library of
imaging functions. They also can configure it using NI
Vision Builder for Automated Inspection software, an
easy-to-use, stand-alone package for fast development and simple
maintenance. NI vision software helps engineers take advantage of
hundreds of imaging processing algorithms, make decisions based on
multiple inspection results, customize user interfaces and
communicate results using I/O and industrial communication
protocols.
Readers can visit www.ni.com/vision to learn more about
the new module and NI vision products.
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